The genetic structure of forty eight Ethiopian Puccinia graminis f. sp. tritici (Pgt)
isolates, representing three major wheat growing regions was investigated using 15
AFLP primer combinations. AFLP analysis generated large number of polymorphic
bands (markers) and allowed easy identification of the different genotypes. The study
showed a high level of genetic diversity within the isolates. There was no population subdivision based on origin of isolates as reflected by a low coefficient of genetic
differentiation (0.107), and a single dendrogram cluster consisting of all isolates except
three. Gene flow among populations was estimated to be high. The AFLP analysis
characterized the isolates to have high genetic diversity and homogeneity across regions. The developed AFLP fingerprints for the Ethiopian Pgt isolates reported herein could support the breeding program to develop strategies for the deployment of resistance genes in its continued effort to minimize the impact of stem rust on wheat in Ethiopia.
